在ADCs設計中，準確地知道其動態(tài)行為的特征參數(shù)非常重要。本書討論了三種典型的測試ADCs的動態(tài)性能的方法，也給出了另外一種測試方法，這種方法避免了典型方法的限制。動態(tài)特性是衡量ADC性能的決定性指標之一，本書給出了測試方法、影響動態(tài)特性的因素以及解決方案。

Preface
Introduction
Jose Machado da Silva
Glossary
Part I ADC Characterisation Based on Sinewave Analysis
1
ADC Applications, Architectures and Terminology
Jose Machado da Silva, Helio Mendonga
1.Introduction
2.ADCs' applications
3.ADCs' architectures
4.Terminology
5.Quantisation and A/D conversion
6.Output coding
7.Errors, non-linearity, noise, and distortion
8.Data acquisition and processing
9.Input characteristics
2
Sinewave Test Setup
Pierre-Yves Roy, Jacques Durand
1.Test Setup description
2.Specification of the clock and input signal
3.Example of filter specification
4.Filter selection
5.Taking a record of data
3
Time-Domain Data Analysis
Dominique Dallet, Djamel Haddadi, Philippe Marchegay
1.Introduction
2.Calculation of the dynamic parameters
3.Definitions
4.The fixed-frequency method
5.The four-parameter method
6.Definitions of THD and SNR
7.The multi-harmonic sine-wave fitting method
8.Estimation of the normalised angular frequency
9.Estimation of the linear parameters
10.On the rank of Ep
11.The algorithm
12.Multitone test to circumvent signal purity problems
4
Frequency-Domain Data Analysis
Pierre- Yves Roy, Jacques Durand
1.Discrete Fourier Transform and Fast Fourier Transform
2.Choice of input and clock frequencies
3.Windowing
4.Comment on the accuracy of the input frequency
5.Record size
6.Calculation of ADC dynamic parameters in the frequency domain
5
Code Histogram Test
Giovanni Chiorboli, Carlo Morandi
1.Introduction
2.The sampling strategy and its contribution to count variance and measurement uncertamty
3.Additional contributions to count uncertainty: additive noise andjitter
4.Factors affecting the p.d.f, of the input signal
5.Required record length and number of records, expression of mea-surement uncertainty
6.Choice of the coverage factor
7.Comparing the number of samples required by random and by syn-chronous sampling.
8.Determining the transfer characteristic
9.Offset error and gain
10.Linearity errors
11.Appendix
6
Comparative Study of ADC Sinewave Test Methods
JoseMachado da Silva, Helio Mendonga, Sara Mazoleni
1.Introduction
2.General considerations
3.Simulation results
4.ATE Implementation
5.Conclusions
Part II Measurement of Additional Parameters
7
Jitter Measurement
Pierre-Yves Roy, Jacques Durand
1.Introduction
2.The double beat technique
3.The joint probability technique
4.Conclusion
8
Differential Gain and Phase Testing
JoseMachado da Silva, Helio Mendonga
1.Introduction
2.Test setup and hardware requirements
3.Analysis
4.Test results
5.Calculation of differential gain and phase from the test results
9
Step and Transient Response Measurement
Giovanni Chiorboli, Carlo Morandi
1.Introduction
2.Settling time and transition duration of step response
3.Frequency response measurement
10
Hysteresis Measurement
Giovanni Chiorboli Carlo Morandi
1.Introduction
2.Test conditions
3.A practical case
4.Collection of samples in HC↑ and HC↓
5.Some warning
References
Index